EXPERIMENTAL-DETERMINATION OF THE PROBE PROFILE IN A DEDICATED SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：12

作者：

BERGER, SD

IMESON, D

MILNE, RH

机构：

来源：

关键词：

D O I：

10.1016/0304-3991(87)90155-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：293 / 296

页数：4

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