EXPERIMENTAL-DETERMINATION OF THE PROBE PROFILE IN A DEDICATED SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引:12
作者
BERGER, SD
IMESON, D
MILNE, RH
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D O I
10.1016/0304-3991(87)90155-0
中图分类号
TH742 [显微镜];
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页码:293 / 296
页数:4
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[13]  
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