IDENTIFICATION OF METALS IN SCANNING-TUNNELING-MICROSCOPY VIA IMAGE STATES

被引:107
作者
JUNG, T [1 ]
MO, YW [1 ]
HIMPSEL, FJ [1 ]
机构
[1] IBM CORP, DIV RES, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
关键词
D O I
10.1103/PhysRevLett.74.1641
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
An oscillatory reversal of the contrast between Cu and Mo is observed with scanning tunneling microscopy (STM), using sample bias voltages of +5 V and higher. It is attributed to tunneling via a series of discrete states that are induced by a combination of the image potential and the applied field. They are offset in energy due to the different work functions of Cu and Mo. This effect provides a generally applicable mechanism for elemental contrast in STM. © 1995 The American Physical Society.
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页码:1641 / 1644
页数:4
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