IDENTIFICATION OF METALS IN SCANNING-TUNNELING-MICROSCOPY VIA IMAGE STATES

被引：107

作者：

JUNG, T ^{[1
]}

MO, YW ^{[1
]}

HIMPSEL, FJ ^{[1
]}

机构：

[1] IBM CORP, DIV RES, TJ WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

PHYSICAL REVIEW LETTERS | 1995年 / 74卷 / 09期

关键词：

D O I：

10.1103/PhysRevLett.74.1641

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

An oscillatory reversal of the contrast between Cu and Mo is observed with scanning tunneling microscopy (STM), using sample bias voltages of +5 V and higher. It is attributed to tunneling via a series of discrete states that are induced by a combination of the image potential and the applied field. They are offset in energy due to the different work functions of Cu and Mo. This effect provides a generally applicable mechanism for elemental contrast in STM. © 1995 The American Physical Society.

引用

页码：1641 / 1644

页数：4

共 18 条

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