CRYOSAMPLER INTERFACE

被引：3

作者：

MOSKOWITZ, PA

FARIS, SM

DAVIDSON, A

机构：

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1983年 / 19卷 / 03期

关键词：

D O I：

10.1109/TMAG.1983.1062374

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：503 / 506

页数：4

共 14 条

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[3]

FARIS SM, UNPUB

[4]

FARIS SM, 1979, Patent No. 4144465

[5]

FRANK DJ, 1982, B AM PHYS SOC, V27, P253

[6] ANALOG MEASUREMENT APPLICATIONS FOR HIGH-SPEED JOSEPHSON SWITCHES [J].

HAMILTON, CA ;

LLOYD, FL ;

KAUTZ, RL .

IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (01) :577-582

[7] INTRINSIC RESPONSE-TIME OF A JOSEPHSON TUNNEL JUNCTION [J].

HARRIS, RE .

PHYSICAL REVIEW B, 1976, 13 (09) :3818-3821

[8] ELECTRONICALLY ADJUSTABLE DELAY FOR JOSEPHSON-TECHNOLOGY [J].

HARRIS, RE ;

WOLF, P ;

MOORE, DF .

ELECTRON DEVICE LETTERS, 1982, 3 (09) :261-263

[9]

LEE FS, 1980, P IEEE INT C CIRCUIT, P687

[10] ELECTRICAL PERFORMANCE OF HIGH-DENSITY PROBE ARRAY FOR TESTING JOSEPHSON CIRCUIT CHIPS [J].

MOSKOWITZ, PA .

IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (01) :761-763

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