TUNNELLING THEORIES OF NONVOLATILE SEMICONDUCTOR MEMORIES

被引:6
作者
FERRISPRABHU, AV [1 ]
机构
[1] IBM CORP,DIV SYST PROD,ESSEX JUNCTION,VT 05452
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1976年 / 35卷 / 01期
关键词
D O I
10.1002/pssa.2210350126
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:243 / 250
页数:8
相关论文
共 19 条
[1]   SIMPLE EQUIVALENT CIRCUIT FOR MNOST MEMORY ELEMENT [J].
BROWN, MACS ;
BOUNDEN, JE ;
VANSTONE, GF .
SOLID-STATE ELECTRONICS, 1972, 15 (06) :707-&
[2]  
CARLSTEDT G, 1972, J SOLID STATE CIRCUI, V7, P382
[3]  
Dorda G., 1970, Physica Status Solidi A, V1, P71, DOI 10.1002/pssa.19700010109
[4]   THEORY OF MNOS MEMORY DEVICE BEHAVIOR [J].
FERRISPRABHU, AV .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (02) :125-134
[5]  
FERRISPRABHU AV, 1974, B AM PHYS SOC, V19, P484
[6]   MAXIMUM TUNNELLING DISTANCE IN MNOS DEVICES - THEORY [J].
FERRISPRABHU, AV .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 11 (01) :81-+
[7]  
FERRISPRABHU AV, 1973, IEEE INT ELECTRONIC, P484
[8]  
FERRISPRABHU AV, 1973, SOLID STATE ELECTRON, V16, P1081
[9]   METAL-NITRIDE-OXIDE-SILICON(MNOS) TRANSISTOR - CHARACTERISTICS AND APPLICATIONS [J].
FROHMANB.D .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (08) :1207-+
[10]   CHARGE TRANSPORT AND STORAGE IN METAL-NITRIDE-OXIDE-SILICON (MNOS) STRUCTURES [J].
FROHMANB.D ;
LENZLINGER, M .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) :3307-+