FLUORESCENCE LIFETIME STUDIES OF MEV ERBIUM IMPLANTED SILICA GLASS

被引：7

作者：

LIDGARD, A

POLMAN, A

JACOBSEN, DC

BLONDER, GE

KISTLER, R

POATE, JM

BECKER, PC

机构：

[1] AT&T Bell Laboratories, Murray Hill

[2] Department of Physics II, Royal Institute of Technology, Stockholm

来源：

ELECTRONICS LETTERS | 1991年 / 27卷 / 11期

关键词：

OPTICAL FIBERS; FLUORESCENCE;

D O I：

10.1049/el:19910619

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

MeV erbium ion implantation into various SiO2 glasses has been studied with the aim of incorporating the rare-earth dopant as an optically active ion in the silica network. The lifetime of the excited state ranges from 1.6 to 12.8 ms, depending on base material and implantation fluence. These results have positive implications for silica-based integrated optical technology.

引用

页码：993 / 995

页数：3

共 5 条

[1] THEORY OF CONCENTRATION QUENCHING IN INORGANIC PHOSPHORS [J].