SURFACE CHARACTERIZATION OF METHYL METHACRYLATE-POLY(ETHYLENE GLYCOL) METHACRYLATE COPOLYMERS BY SECONDARY-ION MASS-SPECTROMETRY AND X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：22

作者：

SHARD, AG

DAVIES, MC

TENDLER, SJB

NICHOLAS, CV

PURBRICK, MD

WATTS, JF

机构：

[1] UNIV NOTTINGHAM,DEPT PHARMACEUT SCI,BIOPHYS & SURFACE ANAL LAB,NOTTINGHAM NG7 2RD,ENGLAND

[2] KODAK LTD,DIV RES,HARROW HA1 4TY,MIDDX,ENGLAND

[3] UNIV SURREY,DEPT MAT SCI & ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND

来源：

MACROMOLECULES | 1995年 / 28卷 / 23期

关键词：

D O I：

10.1021/ma00127a036

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Surface analysis of methyl methacrylate/poly(ethylene glycol) methacrylate copolymers has been carried out using X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS). Both techniques confirm that solvent-cast films of these random copolymers present a surface that is very similar in composition to the bulk. A slight excess of methyl methacrylate units at the polymer/ vacuum interface was noted in the XPS spectra. SSIMS reveals that the top few monolayers of the copolymer films are typical of the bulk material and also confirm the presence of a methoxy end cap in the poly(ethylene glycol) methacrylate macromonomer structure.

引用

页码：7855 / 7859

页数：5

共 20 条

[1]

Beamson G., 1992, HIGH RESOLUTION XPS, DOI 10.1021/ED070PA25.5

[2]

BRIDGETT MJ, 1989, BIOMATERIALS, V10, P411

[3] ANALYSIS OF POLYMER SURFACES BY SIMS .5. THE EFFECTS OF PRIMARY ION MASS AND ENERGY ON SECONDARY ION RELATIVE INTENSITIES [J].