TIC AMORPHIZATION UNDER H IMPLANTATION AT LOW-TEMPERATURE

被引：14

作者：

FOURNIER, D ^{[1
]}

RUAULT, MO ^{[1
]}

SAINTJACQUES, RG ^{[1
]}

机构：

[1] CTR SPECTROMETRIE NUCL & SPECTROMETRIE MASSE, F-91406 ORSAY, FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1987年 / 19-20卷

关键词：

D O I：

10.1016/S0168-583X(87)80111-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：559 / 562

页数：4

共 18 条

[1]

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[2]

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[3] BEHAVIOR OF PLASMA-SPRAYED TIC COATINGS UNDER ELECTRON-BEAM THERMAL SHOCKS [J].

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[5]

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[6]

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[7]

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[8] THE DEVELOPMENT AND LABORATORY TESTING OF LOW-Z REFRACTORY COATINGS FOR FUSION-REACTOR LIMITERS [J].

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MATTOX, DM .

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[9] THE NUCLEATION AND GROWTH OF TID2 IN DEUTERIUM-IMPLANTED TITANIUM [J].

PONTAU, AE ;

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HAGGMARK, LG .

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[10] DEUTERIUM PROFILES IN TITANIUM AND ALLOYS [J].

PONTAU, AE ;

HAGGMARK, LG ;

WILSON, KL ;

BASTASZ, R ;

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BAUER, W .

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