INFRARED OPTICAL-ABSORPTION LOSS OF ANTIREFLECTION COATINGS ON GERMANIUM AND POTASSIUM-CHLORIDE SUBSTRATES AT THE 10-MU-M WAVELENGTH BY THE PHOTOTHERMAL DEFLECTION TECHNIQUE

被引:3
作者
LIU, X
ATANASSOV, G
GU, PF
SAO, Q
TANG, JF
机构
[1] Department of Optical Engineering, Zhejiang University, Hangzhou
来源
APPLIED OPTICS | 1993年 / 32卷 / 28期
关键词
D O I
10.1364/AO.32.005645
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The photothermal deflection technique is used to study the infrared absorption of antireflection coatings on Ge and KCl substrates. The thin films deposited by the thermal resistance evaporation technique, both with and without ion-assisted deposition, are investigated. The experimental results show that Ar-ion bombardment with low energy can evidently reduce the absorption of the coatings.
引用
收藏
页码:5645 / 5648
页数:4
相关论文
共 8 条
[1]   DEVELOPMENT OF A WAVELENGTH SCANNING LASER CALORIMETER [J].
ATKINSON, R .
APPLIED OPTICS, 1985, 24 (04) :464-471
[2]  
Commandre M., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V805, P128, DOI 10.1117/12.941380
[3]   PROPERTIES OF DIELECTRIC COATINGS PRODUCED BY ION ASSISTED DEPOSITION [J].
GU, PF ;
CHEN, YM ;
HU, XQ ;
TANG, JF .
APPLIED OPTICS, 1989, 28 (16) :3318-3322
[4]   SURFACE AND BULK ABSORPTION IN GERMANIUM AT 10.6-MU-M [J].
HUTCHINSON, CJ ;
LEWIS, C ;
SAVAGE, JA ;
PITT, A .
APPLIED OPTICS, 1982, 21 (08) :1490-1495
[5]   PHOTOTHERMAL DEFLECTION SPECTROSCOPY AND DETECTION [J].
JACKSON, WB ;
AMER, NM ;
BOCCARA, AC ;
FOURNIER, D .
APPLIED OPTICS, 1981, 20 (08) :1333-1344
[6]   ION-BEAM-ASSISTED DEPOSITION OF THIN-FILMS [J].
MARTIN, PJ ;
MACLEOD, HA ;
NETTERFIELD, RP ;
PACEY, CG ;
SAINTY, WG .
APPLIED OPTICS, 1983, 22 (01) :178-184
[7]   PHOTOTHERMAL DISPLACEMENT SPECTROSCOPY - AN OPTICAL PROBE FOR SOLIDS AND SURFACES [J].
OLMSTEAD, MA ;
AMER, NM ;
KOHN, S ;
FOURNIER, D ;
BOCCARA, AC .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 32 (03) :141-154
[8]  
SAVAGE JA, 1985, INFRARED OPTICAL MAT, P65