IMAGING OF HYDROGEN-INDUCED SI(111) SURFACE WITH THE SCANNING TUNNELLING MICROSCOPE

被引:8
作者
TOKUMOTO, H
MIKI, K
MURAKAMI, H
MORITA, N
BANDO, H
SAKAI, A
WAKIYAMA, S
ONO, M
KAJIMURA, K
机构
[1] TORAY RES CTR INC,OTSU,SHIGA 520,JAPAN
[2] ELECTROTECH LAB,TSUKUBA,IBARAKI 305,JAPAN
[3] TOSHIBA CORP,KAWASAKI 210,JAPAN
[4] SEIKO INSTRUMENTS LTD,MATSUDO,CHIBA 271,JAPAN
来源
JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷
关键词
D O I
10.1111/j.1365-2818.1988.tb01445.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:743 / 750
页数:8
相关论文
共 22 条
[21]   STRUCTURE-ANALYSIS OF SI(111)-7X7 RECONSTRUCTED SURFACE BY TRANSMISSION ELECTRON-DIFFRACTION [J].
TAKAYANAGI, K ;
TANISHIRO, Y ;
TAKAHASHI, S ;
TAKAHASHI, M .
SURFACE SCIENCE, 1985, 164 (2-3) :367-392
[22]   STRUCTURE OF THE AG/SI(111) SURFACE BY SCANNING TUNNELING MICROSCOPY [J].
WILSON, RJ ;
CHIANG, S .
PHYSICAL REVIEW LETTERS, 1987, 58 (04) :369-372