EXAFS STUDY OF PASSIVE FILMS ON NI AND NI-MO ALLOY ELECTRODES

被引：14

作者：

BOSIO, L ^{[1
]}

CORTES, R ^{[1
]}

DELICHERE, P ^{[1
]}

FROMENT, M ^{[1
]}

JOIRET, S ^{[1
]}

机构：

[1] UNIV PARIS 11,MEN,CEA,CNRS,LURE LP8,F-91405 ORSAY,FRANCE

来源：

SURFACE AND INTERFACE ANALYSIS | 1988年 / 12卷 / 1-12期

关键词：

Electrons--Diffraction - Nickel and Alloys--Surfaces - Nickel Molybdenum Alloys--Surfaces - Spectroscopy; Absorption; -; Spectroscopy; X-ray;

D O I：

10.1002/sia.740120703

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The specular reflectivity of x-rays at sufficiently small grazing angles is absorption-coefficient-dependent so that the EXAFS technique can be used to probe the surface. This method allows in situ measurements. Applications to the study of passive films on nickel and nickel-molybdenum alloy electrodes are presented. In both cases, the passive film is found to be composed of Ni-O entities probably ordered perpendicularly to the electrode. Molybdenum enrichment in the surface layer is confirmed by an increase of the Mo k edge signal.

引用

页码：380 / 384

页数：5

共 11 条

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