A SENSITIVE MODIFIED MACH-ZEHNDER INTERFEROMETER FOR STUDYING ELECTROOPTIC PROPERTIES

被引：6

作者：

PAN, WY ^{[1
]}

JANG, SJ ^{[1
]}

机构：

[1] PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1990年 / 61卷 / 08期

关键词：

D O I：

10.1063/1.1141376

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A modified Mach-Zehnder interferometer has been built for measuring the electro-optic properties of crystals. The system is capable of resolving an optical path length change of 5×10-3 Å. The electro-optic R33 coefficient of the LiNbO3 crystal has been measured; the result is in excellent agreement with the previously reported values.

引用

页码：2109 / 2112

页数：4

共 6 条

[1] INDEX OF REFRACTION IN DIRTY DISPLACIVE FERROELECTRICS [J].