MATERIAL-SURFACES FOR ELECTRON-OPTICAL EQUIPMENT

[1] BOERSCH H, 1939, Z TECH PHYS, V20, P346

[2] BOERSCH H, 1966, 6 INT C EL MICR, V1, P167

[3] BACKSCATTERING OF 10-100 KEV ELECTRONS FROM THICK TARGETS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (01) : 85 - 93

[4] GLASER W, 1953, GRUNDLAGEN ELEKTRONE, P28

[5] ELECTRODE CONTAMINATION IN ELECTRON OPTICAL SYSTEMS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1953, 66 (403): : 542 - 547

[6] POZZI G, 1968, 4 P EUR REG C EL MIC, V1, P355

[7] POZZI G, 1970, 7 P INT C EL MICR, V1, P305

[8] MEASURING THE BACKSCATTERING COEFFICIENT AND SECONDARY-ELECTRON YIELD INSIDE A SCANNING ELECTRON-MICROSCOPE [J]. SCANNING, 1980, 3 (01) : 35 - 39

[9] HERSTELLUNG DUNNWANDIGER OBJEKTIVAPERTURBLENDEN FUR DIE ELEKTRONENMIKROSKOPIE [J]. NATURWISSENSCHAFTEN, 1967, 54 (07) : 163 - &

[1] BOERSCH H, 1939, Z TECH PHYS, V20, P346

[2] BOERSCH H, 1966, 6 INT C EL MICR, V1, P167

[3] BACKSCATTERING OF 10-100 KEV ELECTRONS FROM THICK TARGETS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (01) : 85 - 93

[4] GLASER W, 1953, GRUNDLAGEN ELEKTRONE, P28

[5] ELECTRODE CONTAMINATION IN ELECTRON OPTICAL SYSTEMS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1953, 66 (403): : 542 - 547

[6] POZZI G, 1968, 4 P EUR REG C EL MIC, V1, P355

[7] POZZI G, 1970, 7 P INT C EL MICR, V1, P305

[8] MEASURING THE BACKSCATTERING COEFFICIENT AND SECONDARY-ELECTRON YIELD INSIDE A SCANNING ELECTRON-MICROSCOPE [J]. SCANNING, 1980, 3 (01) : 35 - 39

[9] HERSTELLUNG DUNNWANDIGER OBJEKTIVAPERTURBLENDEN FUR DIE ELEKTRONENMIKROSKOPIE [J]. NATURWISSENSCHAFTEN, 1967, 54 (07) : 163 - &