AU/SI(111) OVERLAYER - CHARACTERIZATION BY TUNNELING MICROSCOPY AND SPECTROSCOPY

被引：58

作者：

SALVAN, F ^{[1
]}

FUCHS, H ^{[1
]}

BARATOFF, A ^{[1
]}

BINNIG, G ^{[1
]}

机构：

[1] IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

来源：

关键词：

D O I：

10.1016/0039-6028(85)90959-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：634 / 639

页数：6

共 17 条

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BARATOFF, A
BINNIG, G
ROHRER, H
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (03): : 703 - 704
[2] THEORY OF SCANNING TUNNELING MICROSCOPY METHODS AND APPROXIMATIONS
BARATOFF, A
[J]. PHYSICA B & C, 1984, 127 (1-3): : 143 - 150
[3] BARATOFF A, UNPUB
[4] BARATOFF A, 1983, EUR C ABSTR B, V7, P369
[5] BINNIG G, 1984, PHYSICA B & C, V127, P37, DOI 10.1016/S0378-4363(84)80008-X
[6] BINNIG G, 1985, SURF SCI, V157, pL373, DOI 10.1016/0039-6028(85)90666-1
[7] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
BINNIG, G
ROHRER, H
GERBER, C
WEIBEL, E
[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[8] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[9] BINNIG G, 17TH P INT C PHYS SE
[10] BINNIG G, UNPUB