QUANTITATIVE DEPTH-PROFILING WITH GDOS - APPLICATION TO ZNNI-ELECTROGALVANIZED STEEL SHEETS

被引：13

作者：

ANGELI, J

KALTENBRUNNER, T

ANDROSCH, FM

机构：

[1] VOEST-ALPINE STAHL LINZ GmbH, Research, Development and Testing Techniques, Linz, A-4031

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1991年 / 341卷 / 1-2期

关键词：

D O I：

10.1007/BF00322125

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Studies are made on quantitative GDOS depth profile analysis for ZnNi-coatings. Relative and absolute depth resolution on the interface ZnNi-coating/steel substrate were evaluated in a thickness range of 0.5 to 5-mu-m using two different anode tube diameters. For quantification, an improved approach of the model of constant emission yield was established. The results are demonstrated on ZnNi-electrodeposits with different coating thickness and chemical content.

引用

页码：140 / 144

页数：5

共 13 条

[1] DEPTH RESOLUTION OF SPUTTER PROFILING [J].