A CORRELATION BETWEEN ELECTROCHEMICAL-BEHAVIOR, COMPOSITION AND SEMICONDUCTING PROPERTIES OF NATURALLY GROWN OXIDE-FILMS ON COPPER

被引：79

作者：

MILLET, B ^{[1
]}

FIAUD, C ^{[1
]}

HINNEN, C ^{[1
]}

SUTTER, EMM ^{[1
]}

机构：

[1] ECOLE NATL SUPER CHIM, CNRS,PHYSICOCHIM SURFACE LAB, F-75231 PARIS 05, FRANCE

来源：

CORROSION SCIENCE | 1995年 / 37卷 / 12期

关键词：

D O I：

10.1016/0010-938X(95)00072-R

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Copper(I) oxide films formed under open-circuit potential in neutral aqueous solutions have been characterized, using coulometry, photocurrent spectroscopy and X-ray photo-electron spectroscopy (XPS). The reduction potential of the oxide layer was found to depend on the presence in the electrolyte of chloride ions, Cu(II) or Cu(I) ionic species or of a corrosion inhibitor. XPS analyses were performed on these oxide layers, and showed in some cases an evolution of the oxidation state of copper from +2 to +1 state throughout the film. Different conducting properties of the cuprous oxides could be demonstrated through photo-electrochemical measurements, and the formation of a duplex Cu2O layer with two semiconducting components of different stoichiometries was discussed.

引用

页码：1903 / 1918

页数：16

共 28 条

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