THE LIMITATIONS TO RESOLUTION IN THE OBSERVATION OF RADIATION-SENSITIVE SPECIMENS BY ELECTRON-MICROSCOPY

被引：14

作者：

BOUDET, A ^{[1
]}

KUBIN, LP ^{[1
]}

机构：

[1] FAC SCI POITIERS,MET PHYS LAB,CNRS,LA 131,F-86022 POITIERS,FRANCE

来源：

ULTRAMICROSCOPY | 1982年 / 8卷 / 04期

关键词：

D O I：

10.1016/0304-3991(82)90064-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：409 / 416

页数：8

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[6]

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[8] RATE OF DAMAGE OF POLYMER CRYSTALS IN ELECTRON MICROSCOPE - DEPENDENCE ON TEMPERATURE AND BEAM VOLTAGE [J].

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[9]

HAHN M, 1980, ELECTRON MICROS, P200

[10] IMAGE RECORDING IN ELECTRON MICROSCOPY [J].

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