KODIREX FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：19

作者：

DORIGNAC, D ^{[1
]}

MACLACHLAN, MEC ^{[1
]}

JOUFFREY, B ^{[1
]}

机构：

[1] CNRS,OPT ELECTR LAB,F-31055 TOULOUSE,FRANCE

来源：

ULTRAMICROSCOPY | 1976年 / 2卷 / 01期

关键词：

D O I：

10.1016/S0304-3991(76)90365-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：49 / 52

页数：4

共 24 条

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AKAGI, M ;

ISHIBA, T ;

KANEKO, T .

APPLIED PHYSICS LETTERS, 1972, 21 (03) :93-&

[2] SENSITIVITY AND DETECTIVE QUANTUM EFFICIENCY OF ELECTRON-MICROSCOPE PLATES AT HIGH VOLTAGES [J].

AST, DG .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) :4638-4643

[3] RESPONSE OF PHOTOGRAPHIC EMULSIONS TO ELECTRONS IN ENERGY RANGE 7-60 KEV [J].

BURGE, RE ;

GARRARD, DF ;

BROWNE, MT .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07) :707-&

[4] RESOLUTION OF PHOTOGRAPHIC EMULSIONS FOR ELECTRONS IN ENERGY RANGE 7-60 KEV [J].

BURGE, RE ;

GARRARD, DF .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (07) :715-+

[5]

COSSLETT VE, 1947, HIGH VOLTAGE ELECTRO, P147

[6]

Dainty J. C., 1974, IMAGE SCI

[7] QUANTITATIVE APPROACH TO MOLECULAR RESOLUTION ELECTRON-MICROSCOPY [J].

DORIGNAC, D ;

MACLACHLAN, MEC ;

JOUFFREY, B .

NATURE, 1976, 264 (5586) :533-534

[8]

DORIGNAC D, 1975, MICROSC ELECTRON, P143

[9]

FRIESER H, 1958, 4 P INT C EL BERL, P116

[10]

GLAESER RM, 1975, MICROSC ELECTRON, P165

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