Improved emission stability of carburized HfC<100> and ultrasharp tungsten field emitters

被引:28
作者
Yu, ML [1 ]
Hussey, BW [1 ]
Kratschmer, E [1 ]
Chang, THP [1 ]
Mackie, WA [1 ]
机构
[1] LINFIELD COLL,LINFIELD RES INST,MCMINNVILLE,OR 97128
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 06期
关键词
D O I
10.1116/1.588016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have evaluated the cold-field-emission characteristics of HfC(100) and ultrasharp tungsten emitters. We found that proper acetylene treatment improved both the angular current confinement and the emission stability of thermally cleaned HfC(100) tips. Stable emission exceeding 10 mu A/sr for over 1 h and angular confinement to a 3 degrees semicone angle have been observed, The improvements are probably related to the modified work function and surface chemical composition induced by the acetylene treatment at the tip apex, Carburization of W(100) acid W(111) tips also significantly improved the emission current stability. This study indicates the usefulness of surface processing in the development of cold-field emitters. (C) 1995 American Vacuum Society.
引用
收藏
页码:2436 / 2440
页数:5
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