ELECTRON-OPTICAL PERFORMANCE OF A SCANNING TUNNELING MICROSCOPE CONTROLLED FIELD-EMISSION MICROLENS SYSTEM

被引：39

作者：

CHANG, THP

KERN, DP

MCCORD, MA

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 06期

关键词：

D O I：

10.1116/1.584680

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：1855 / 1861

页数：7

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