MEASUREMENT OF PICOSECOND ULTRAVIOLET-LASER PULSE-WIDTHS USING AN ELECTRICAL AUTO-CORRELATOR

被引:2
作者
BOKOR, J [1 ]
BUCKSBAUM, PH [1 ]
AUSTON, DH [1 ]
机构
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
关键词
D O I
10.1063/1.93926
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:342 / 344
页数:3
相关论文
共 10 条
[1]   PICOSECOND OPTOELECTRONIC DETECTION, SAMPLING, AND CORRELATION-MEASUREMENTS IN AMORPHOUS-SEMICONDUCTORS [J].
AUSTON, DH ;
JOHNSON, AM ;
SMITH, PR ;
BEAN, JC .
APPLIED PHYSICS LETTERS, 1980, 37 (04) :371-373
[2]  
AUSTON DH, UNPUB
[3]   AMPLIFICATION OF ULTRASHORT PULSES IN KRYPTON FLUORIDE AT 248-NM [J].
BUCKSBAUM, PH ;
BOKER, J ;
STORZ, RH ;
WHITE, JC .
OPTICS LETTERS, 1982, 7 (09) :399-401
[4]  
EGGER H, COMMUNICATION
[5]   UV PICOSECOND PULSE AMPLIFICATION BY A XECL LASER [J].
MAEDA, M ;
MIZUNAMI, T ;
SATO, A ;
UCHINO, O ;
MIYAZOE, Y .
APPLIED PHYSICS LETTERS, 1980, 36 (08) :636-638
[6]   ULTRAVIOLET-LASER, SHORT PULSE-WIDTH MEASUREMENT BY MULTI-PHOTON IONIZATION AUTO-CORRELATION [J].
RAYNER, DM ;
HACKETT, PA ;
WILLIS, C .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (04) :537-538
[7]  
SEEGER K, 1973, SEMICONDUCTOR PHYSIC, P52
[8]   DYNAMICS OF PHOTOEXCITED GAAS BAND-EDGE ABSORPTION WITH SUBPICOSECOND RESOLUTION [J].
SHANK, CV ;
FORK, RL ;
LEHENY, RF ;
SHAH, J .
PHYSICAL REVIEW LETTERS, 1979, 42 (02) :112-115
[9]   PICOSECOND PHOTOCONDUCTIVITY IN RADIATION-DAMAGED SILICON-ON-SAPPHIRE FILMS [J].
SMITH, PR ;
AUSTON, DH ;
JOHNSON, AM ;
AUGUSTYNIAK, WM .
APPLIED PHYSICS LETTERS, 1981, 38 (01) :47-50
[10]   PICOSECOND XEF AMPLIFIED LASER-PULSES [J].
TOMOV, IV ;
FEDOSEJEVS, R ;
RICHARDSON, MC ;
SARJEANT, WJ ;
ALCOCK, AJ ;
LEOPOLD, KE .
APPLIED PHYSICS LETTERS, 1977, 30 (03) :146-148