SCANNING-X-RAY RADIOGRAPHY - 1ST TESTS IN AN ELECTRON SPECTROMETER

[1] CAZAUX J, 1979, J MICROSC SPECT ELEC, V4, P319

[2] ELECTRON-SPECTROSCOPY FOR BULK AND SURFACE MICROSCOPY AND MICROANALYSIS [J]. MATERIALS SCIENCE AND ENGINEERING, 1980, 42 (1-2): : 45 - 48

[3] CAZAUX J, 1979, J PHYS LETT-PARIS, V40, pL227, DOI 10.1051/jphyslet:019790040011022700

[4] CAZAUX J, UNPUB

[5] ELISEENKO LG, 1968, SOV PHYS TECH PHYS-U, V13, P122

[6] MEASUREMENTS OF K,L AND M SHELL X-RAY PRODUCTION EFFICIENCIES [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (04) : 425 - &

[7] SCANNING X-RAY MICROSCOPE USING SYNCHROTRON RADIATION [J]. SCIENCE, 1972, 178 (4061) : 608 - &

[8] HUMPHREYS CJ, 1979, INTRO ANAL ELECTRON, P311

[9] PATTEE HH, 1953, J OPT SOC AM, V43, P61

[10] RARBACK H, 1980, SCANNED IMAGE MICROS, P449

[1] CAZAUX J, 1979, J MICROSC SPECT ELEC, V4, P319

[2] ELECTRON-SPECTROSCOPY FOR BULK AND SURFACE MICROSCOPY AND MICROANALYSIS [J]. MATERIALS SCIENCE AND ENGINEERING, 1980, 42 (1-2): : 45 - 48

[3] CAZAUX J, 1979, J PHYS LETT-PARIS, V40, pL227, DOI 10.1051/jphyslet:019790040011022700

[4] CAZAUX J, UNPUB

[5] ELISEENKO LG, 1968, SOV PHYS TECH PHYS-U, V13, P122

[6] MEASUREMENTS OF K,L AND M SHELL X-RAY PRODUCTION EFFICIENCIES [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (04) : 425 - &

[7] SCANNING X-RAY MICROSCOPE USING SYNCHROTRON RADIATION [J]. SCIENCE, 1972, 178 (4061) : 608 - &

[8] HUMPHREYS CJ, 1979, INTRO ANAL ELECTRON, P311

[9] PATTEE HH, 1953, J OPT SOC AM, V43, P61

[10] RARBACK H, 1980, SCANNED IMAGE MICROS, P449