ELECTRON-SPECTROSCOPY FOR BULK AND SURFACE MICROSCOPY AND MICROANALYSIS

被引:6
作者
CAZAUX, J
机构
来源
MATERIALS SCIENCE AND ENGINEERING | 1980年 / 42卷 / 1-2期
关键词
D O I
10.1016/0025-5416(80)90008-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:45 / 48
页数:4
相关论文
共 8 条
[1]  
Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]
[2]   X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES [J].
CAZAUX, J .
REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (05) :263-280
[3]  
CAZAUX J, 1977, J PHYS LETT-PARIS, V38, pL473
[4]  
CAZAUX J, 1979, J PHYS LETT-PARIS, V40, pL227, DOI 10.1051/jphyslet:019790040011022700
[5]  
HOVLAND CT, 1976, APPL PHYS LETT, V30, P73
[6]  
HOVLAND CT, 1977, 7TH P INT VAC C 3RD, P2363
[7]  
KIRSCHNER J, 1977, TOP CURR PHYS, V4, P103
[8]  
SIEGBAHN K, 1967, NOVAACTA REGIAE SOC, V20