HYDROGEN ANALYSIS AS A FUNCTION OF DEPTH FOR HYDROGENOUS FILMS AND POLYMERS BY PROTON RECOIL DETECTION

被引：37

作者：

INGRAM, DC

MCCORMICK, AW

PRONKO, PP

CARLSON, JD

WOOLLAM, JA

机构：

[1] LORD CORP,RES CTR,CARY,NC 27511

[2] UNIV NEBRASKA,DEPT ELECT ENGN,LINCOLN,NE 68588

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 6卷 / 1-2期

关键词：

D O I：

10.1016/0168-583X(85)90669-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：430 / 434

页数：5

共 6 条

[1]

CARLSON JD, 1983, MATERIALS RES SOC AN

[2]

Chu WK., 1978, BACKSCATTERING SPECT

[3]

KRAMER EJ, 1984, B AM PHYS SOC, V29, P409

[4] ACCURATE AND SENSITIVE METHOD FOR DETERMINATION OF DEPTH DISTRIBUTION OF LIGHT ELEMENTS IN HEAVY MATERIALS [J].

LECUYER, J ;

BRASSARD, C ;

CARDINAL, C ;

CHABBAL, J ;

DESCHENES, L ;

LABRIE, JP ;

TERREAULT, B ;

MARTEL, JG ;

STJACQUES, R .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (01) :381-382

[5] HELIUM-INDUCED HYDROGEN RECOIL ANALYSIS FOR METALLURGICAL APPLICATIONS [J].

WIELUNSKI, LS ;

BENENSON, RE ;

LANFORD, WA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3) :120-124

[6] PROFILING HYDROGEN IN MATERIALS USING ION-BEAMS [J].

ZIEGLER, JF ;

WU, CP ;

WILLIAMS, P ;

WHITE, CW ;

TERREAULT, B ;

SCHERZER, BMU ;

SCHULTE, RL ;

SCHNEID, EJ ;

MAGEE, CW ;

LIGEON, E ;

LECUYER, J ;

LANFORD, WA ;

KUEHNE, FJ ;

KAMYKOWSKI, EA ;

HOFER, WO ;

GUIVARCH, A ;

FILLEUX, CH ;

DELINE, VR ;

EVANS, CA ;

COHEN, BL ;

CLARK, GJ ;

CHU, WK ;

BRASSARD, C ;

BLEWER, RS ;

BEHRISCH, R ;

APPLETON, BR ;

ALLRED, DD .

NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :19-39

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