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HIGH-SPEED OPTICAL-SAMPLING MEASUREMENT OF ELECTRICAL WAVE-FORM USING A SCANNING TUNNELING MICROSCOPE

被引：23
作者：
TAKEUCHI, K
KASAHARA, Y
机构：
[1] Teratec Corporation, 2-9-32 Naka-cho, Tokyo 180, Musashino-shi
来源：
APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 26期
关键词：
D O I：
10.1063/1.110763
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The optical sampling measurement of a high-speed electrical wave form using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train from a laser diode (LD) is used to turn on and off a photoconductive switch on a STM probe to measure a signal from a Schottky barrier diode (SBD) in a sampling procedure. A time resolution less than 300 ps has been achieved. This novel method has the potential to create a breakthrough in ultra-high-speed wave form measurement through this unique combination of optical sampling and STM technology.
引用
收藏
页码：3548 / 3552
页数：5
相关论文
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