HIGH-SPEED OPTICAL-SAMPLING MEASUREMENT OF ELECTRICAL WAVE-FORM USING A SCANNING TUNNELING MICROSCOPE

被引:23
作者
TAKEUCHI, K
KASAHARA, Y
机构
[1] Teratec Corporation, 2-9-32 Naka-cho, Tokyo 180, Musashino-shi
关键词
D O I
10.1063/1.110763
中图分类号
O59 [应用物理学];
学科分类号
摘要
The optical sampling measurement of a high-speed electrical wave form using a scanning tunneling microscope (STM) is demonstrated. An optical pulse train from a laser diode (LD) is used to turn on and off a photoconductive switch on a STM probe to measure a signal from a Schottky barrier diode (SBD) in a sampling procedure. A time resolution less than 300 ps has been achieved. This novel method has the potential to create a breakthrough in ultra-high-speed wave form measurement through this unique combination of optical sampling and STM technology.
引用
收藏
页码:3548 / 3552
页数:5
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