SINGLE-ELECTRON CHARGING AND PERIODIC CONDUCTANCE RESONANCES IN GAAS NANOSTRUCTURES

被引:530
作者
MEIRAV, U
KASTNER, MA
WIND, SJ
机构
[1] MIT,ELECTR RES LAB,CAMBRIDGE,MA 02139
[2] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
关键词
D O I
10.1103/PhysRevLett.65.771
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Narrow channels interrupted by two controlled potential barriers and having a tunable electron density were made in GaAs, and their conductance was measured at low temperatures. Reproducible and accurately periodic oscillations of the conductance with changing density are found to correspond to the sequential addition of single electrons to the segment of the channel between the barriers. Detailed examination of the line shape of the conductance versus density provides a new insight into the transport mechanism. © 1990 The American Physical Society.
引用
收藏
页码:771 / 774
页数:4
相关论文
共 25 条
  • [1] AMMAN M, 1988, APPL PHYS, V65, P339
  • [2] AVERIN DV, 1990, QUANTUM EFFECTS SMAL
  • [3] FINITE-TEMPERATURE CONDUCTANCE IN ONE DIMENSION
    AZBEL, MY
    DIVINCENZO, DP
    [J]. PHYSICAL REVIEW B, 1984, 30 (12): : 6877 - 6888
  • [4] DIFFERENTIAL NEGATIVE-RESISTANCE IN A ONE-DIMENSIONAL MESOSCOPIC SYSTEM DUE TO SINGLE-ELECTRON TUNNELING
    BROWN, RJ
    PEPPER, M
    AHMED, H
    HASKO, DG
    RITCHIE, DA
    FROST, JEF
    PEACOCK, DC
    JONES, GAC
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 1990, 2 (08) : 2105 - 2109
  • [5] FIELD SB, IN PRESS
  • [6] FOWLER AB, 1986, PHYS REV LETT, V57, P128
  • [7] OBSERVATION OF SINGLE-ELECTRON CHARGING EFFECTS IN SMALL TUNNEL-JUNCTIONS
    FULTON, TA
    DOLAN, GJ
    [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (01) : 109 - 112
  • [8] COULOMB OSCILLATIONS OF THE CONDUCTANCE IN A LATERALLY CONFINED HETEROSTRUCTURE
    GLAZMAN, LI
    SHEKHTER, RI
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (33) : 5811 - 5815
  • [9] GLAZMAN LI, UNPUB
  • [10] RESONANT TUNNELING THROUGH SINGLE ELECTRONIC STATES AND ITS SUPPRESSION IN A MAGNETIC-FIELD
    KOPLEY, TE
    MCEUEN, PL
    WHEELER, RG
    [J]. PHYSICAL REVIEW LETTERS, 1988, 61 (14) : 1654 - 1657