ELECTRICAL-CONDUCTION AND BREAKDOWN IN OXIDES OF POLYCRYSTALLINE SILICON AND THEIR CORRELATION WITH INTERFACE TEXTURE

被引：68

作者：

HEIMANN, PA

MURARKA, SP

SHENG, TT

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 09期

关键词：

D O I：

10.1063/1.331540

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：6240 / 6245

页数：6

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