THEORY OF THE REFLECTION OF LIGHT FROM SEMICONDUCTING SURFACE LAYERS AT THE PLASMA FREQUENCY

被引：3

作者：

BERZ, F

机构：

来源：

SURFACE SCIENCE | 1964年 / 2卷

关键词：

D O I：

10.1016/0039-6028(64)90045-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：75 / 85

页数：11

共 14 条

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[7]

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[8] A NONDESTRUCTIVE MEASUREMENT OF CARRIER CONCENTRATION IN HEAVILY DOPED SEMICONDUCTING MATERIALS AND ITS APPLICATION TO THIN SURFACE LAYERS [J].

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[9] PLASMA RESONANCE ABSORPTION IN THIN METAL FILMS [J].

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[10]

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