AMPLITUDE-MODULATION REFLECTOMETRY FOR LARGE FUSION DEVICES

One of the main problems which arises in density profile measurements by reflectometry is the need for continuous tracking of the phase delay; fast density fluctuations and strong modulation on the amplitude of the reflected signal can cause "fringe jumps" in the phase signal. Amplitude modulation reflectometry performs a time delay measurement by the determination of the phase delay of the modulating envelope of a millimeter wave reflected by the plasma. The phase delays involved are small, the measurement is not affected by the fluctuations and can be directly performed without complicated fringe counters; the method provides a promising possibility for real time determination of the plasma position and density profile. In the present paper the principles of the method are presented as well as the analysis on the effects of phase and amplitude fluctuations, dispersive effects, and accuracy requirements.