FAR INFRARED SCHLIEREN EXPERIMENT PERFORMED ON A CARBON ARC

[1] TPX A NEW MATERIAL FOR OPTICAL COMPONENTS IN FAR INFRA-RED SPECTRAL REGION [J]. INFRARED PHYSICS, 1969, 9 (01): : 31 - &

[2] DIFFRACTION LIMITATIONS FOR PLASMA ELECTRON-DENSITY MEASUREMENTS WITH SCHLIEREN METHODS [J]. APPLIED OPTICS, 1975, 14 (10): : 2537 - 2541

[3] APPLICATION OF EVAPOROGRAPHY TO IMAGING OF FAR-INFRARED RADIATION-PATTERNS [J]. INFRARED PHYSICS, 1976, 16 (1-2): : 237 - 242

[4] DODEL G, TO BE PUBLISHED

[5] VISUAL OBSERVATION OF SUBMILLIMETER WAVE LASER BEAMS [J]. APPLIED PHYSICS LETTERS, 1971, 18 (10) : 452 - &

[6] KEILMANN F, 1970, IPPIV4 I PLASM REP

[7] QUANTITATIVE SCHLIEREN TECHNIQUES APPLIED TO HIGH CURRENT ARC INVESTIGATIONS [J]. APPLIED OPTICS, 1972, 11 (08) : 1822 - +

[8] ELEKTRONENDICHTE UND TEMPERATUR IN DER SAULE DES HOCHSTROMKOHLEBOGENS [J]. ZEITSCHRIFT FUR PHYSIK, 1953, 136 (02): : 119 - 136

[9] MARTELLUCCI S, 1967, NUOVO CIMENTO 1 S3, P642

[10] Wolter H., 1956, HDB PHYS, V24, P555

[1] TPX A NEW MATERIAL FOR OPTICAL COMPONENTS IN FAR INFRA-RED SPECTRAL REGION [J]. INFRARED PHYSICS, 1969, 9 (01): : 31 - &

[2] DIFFRACTION LIMITATIONS FOR PLASMA ELECTRON-DENSITY MEASUREMENTS WITH SCHLIEREN METHODS [J]. APPLIED OPTICS, 1975, 14 (10): : 2537 - 2541

[3] APPLICATION OF EVAPOROGRAPHY TO IMAGING OF FAR-INFRARED RADIATION-PATTERNS [J]. INFRARED PHYSICS, 1976, 16 (1-2): : 237 - 242

[4] DODEL G, TO BE PUBLISHED

[5] VISUAL OBSERVATION OF SUBMILLIMETER WAVE LASER BEAMS [J]. APPLIED PHYSICS LETTERS, 1971, 18 (10) : 452 - &

[6] KEILMANN F, 1970, IPPIV4 I PLASM REP

[7] QUANTITATIVE SCHLIEREN TECHNIQUES APPLIED TO HIGH CURRENT ARC INVESTIGATIONS [J]. APPLIED OPTICS, 1972, 11 (08) : 1822 - +

[8] ELEKTRONENDICHTE UND TEMPERATUR IN DER SAULE DES HOCHSTROMKOHLEBOGENS [J]. ZEITSCHRIFT FUR PHYSIK, 1953, 136 (02): : 119 - 136

[9] MARTELLUCCI S, 1967, NUOVO CIMENTO 1 S3, P642

[10] Wolter H., 1956, HDB PHYS, V24, P555