INTERPRETATION OF DEEP-LEVEL OPTICAL SPECTROSCOPY AND DEEP-LEVEL TRANSIENT SPECTROSCOPY DATA - APPLICATION TO IRRADIATION DEFECTS IN GAAS

被引：52

作者：

LOUALICHE, S

NOUAILHAT, A

GUILLOT, G

LANNOO, M

机构：

[1] INST NATL SCI APPL LYON,PHYS MATIERE LAB,F-69621 VILLEURBANNE,FRANCE

[2] INST SUPER ELECTR NORD,CNRS,PHYS SOLIDES LAB 253,F-59046 LILLE,FRANCE

来源：

PHYSICAL REVIEW B | 1984年 / 30卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.30.5822

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5822 / 5834

页数：13

共 52 条

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