TEMPERATURE DISTRIBUTION IN A CRACKED STRIPE

被引:4
作者
CHAUG, YS [1 ]
HUANG, HL [1 ]
机构
[1] NATL TAIWAN UNIV,DEPT PHYS,TAIPEI,TAIWAN
关键词
D O I
10.1143/JJAP.14.431
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:431 / 432
页数:2
相关论文
共 3 条
[1]   ELECTROMIGRATION IN THIN SILVER, COPPER, GOLD, INDIUM, TIN, LEAD AND MAGNESIUM FILMS [J].
BREITLING, HM ;
HUMMEL, RE .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1972, 33 (04) :845-+
[2]  
CHHABRA DS, 1967, TR22419 IBM
[3]  
JEPSON DW, 1967, NC753 IBM