CATHODOLUMINESCENCE SCANNING ELECTRON-MICROSCOPY OF SEMICONDUCTORS

[1] AKAMATSU B, 1983, SCAN ELECTRON MICROS, P1579

[2] CATHODOLUMINESCENT EFFICIENCY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) : 1136 - 1138

[3] [Anonymous], 1959, PROGR THEOR PHYS SUP

[4] [Anonymous], 1981, POINT DEFECTS SEMICO

[5] Aven M., 1973, Journal of Luminescence, V7, P195, DOI 10.1016/0022-2313(73)90067-7

[6] AVEN M, 1967, PHYSICS CHEM 2 6 COM

[7] ASSESSMENT OF DEFECTS IN AS-GROWN III-V MULTILAYER STRUCTURES BY DIFFERENTIATED CATHODOLUMINESCENCE TOPOGRAPHY (DCLT) [J]. JOURNAL OF ELECTRONIC MATERIALS, 1980, 9 (02) : 311 - 334

[8] Balk L. J., 1976, Scanning Electron Microscopy 1976. I, P257

[9] BALK LJ, 1983, I PHYS C SER, V67, P387

[10] BALK LJ, 1977, SEM, V1, P739

[1] AKAMATSU B, 1983, SCAN ELECTRON MICROS, P1579

[2] CATHODOLUMINESCENT EFFICIENCY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) : 1136 - 1138

[3] [Anonymous], 1959, PROGR THEOR PHYS SUP

[4] [Anonymous], 1981, POINT DEFECTS SEMICO

[5] Aven M., 1973, Journal of Luminescence, V7, P195, DOI 10.1016/0022-2313(73)90067-7

[6] AVEN M, 1967, PHYSICS CHEM 2 6 COM

[7] ASSESSMENT OF DEFECTS IN AS-GROWN III-V MULTILAYER STRUCTURES BY DIFFERENTIATED CATHODOLUMINESCENCE TOPOGRAPHY (DCLT) [J]. JOURNAL OF ELECTRONIC MATERIALS, 1980, 9 (02) : 311 - 334

[8] Balk L. J., 1976, Scanning Electron Microscopy 1976. I, P257

[9] BALK LJ, 1983, I PHYS C SER, V67, P387

[10] BALK LJ, 1977, SEM, V1, P739