FIELD DESORPTION OF HELIUM AND NEON FROM TUNGSTEN AND IRIDIUM

被引：13

作者：

PANITZ, JA ^{[1
]}

机构：

[1] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1975年 / 12卷 / 01期

关键词：

D O I：

10.1116/1.568717

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：210 / 212

页数：3

共 14 条

[1] MCKINNEY JT, 1969, 16 FIELD EM S PITTSB
[2] MOORE AJW, 1974, 21ST FIELD EM S MARS
[3] ATOM-PROBE FIM ANALYSIS OF INTERACTION OF IMAGING GAS WITH SURFACE
MULLER, EW
KRISHNASWAMY, SV
MCLANE, SB
[J]. SURFACE SCIENCE, 1970, 23 (01) : 112 - +
[4] FIELD EVAPORATION OF TUNGSTEN-HELIUM MOLECULAR IONS
MULLER, EW
KRISHNASWAMY, SV
MCLANE, SB
[J]. PHYSICAL REVIEW LETTERS, 1973, 31 (21) : 1282 - 1284
[5] FIELD ADSORPTION AND DESORPTION OF HELIUM AND NEON
MULLER, EW
MCLANE, SB
PANITZ, JA
[J]. SURFACE SCIENCE, 1969, 17 (02) : 430 - &
[6] ENERGY SPECTRUM OF FIELD IONIZATION AT A SINGLE ATOMIC SITE
MULLER, EW
KRISHNASWAMY, SV
[J]. SURFACE SCIENCE, 1973, 36 (01) : 29 - 47
[7] MULLER EW, 1973, PROGR SURFACE SCI, V4, P48
[8] MULLER EW, 1968, 15 FIELD EM S BONN
[9] MULLER EW, PRIVATE COMMUNICATIO
[10] CALIBRATION OF ATOM PROBE FIM
PANITZ, JA
MCLANE, SB
MULLER, EW
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (10) : 1321 - &