MEMORY SYSTEM-DESIGN FOR TOLERATING SINGLE EVENT UPSETS

被引：17

作者：

ABRAHAM, JA

DAVIDSON, ES

PATEL, JH

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 06期

关键词：

D O I：

10.1109/TNS.1983.4333134

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4339 / 4344

页数：6

共 17 条

[1] SINGLE EVENT UPSETS IN NMOS MICROPROCESSORS [J].

GUENZER, CS ;

CAMPBELL, AB ;

SHAPIRO, P .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :3955-3958

[2] SINGLE EVENT UPSET OF DYNAMIC RAMS BY NEUTRONS AND PROTONS [J].

GUENZER, CS ;

WOLICKI, EA ;

ALLAS, RG .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (06) :5048-5053

[3] FTMP - HIGHLY RELIABLE FAULT-TOLERANT MULTIPROCESSOR FOR AIRCRAFT [J].

HOPKINS, AL ;

SMITH, TB ;

LALA, JH .

PROCEEDINGS OF THE IEEE, 1978, 66 (10) :1221-1239

[4]

KATZMAN JA, 1978, 11TH P HAW INT C SYS, P85

[5] SOFT ERROR SUSCEPTIBILITY OF CMOS RAMS - DEPENDENCE UPON POWER-SUPPLY VOLTAGE [J].

KOLASINSKI, WA ;

KOGA, R ;

BLAKE, JB ;

DIEHL, SE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4013-4016

[6]

Peterson WW, 1972, ERROR CORRECTING COD

[7] CMOS RAM COSMIC-RAY-INDUCED ERROR-RATE ANALYSIS [J].

PICKEL, JC ;

BLANDFORD, JT .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :3962-3967

[8] COSMIC-RAY INDUCED ERRORS IN MOS MEMORY CELLS [J].

PICKEL, JC ;

BLANDFORD, JT .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (06) :1166-1171

[9]

PRADHAN DK, 1980, COMPUTER, V13, P27, DOI 10.1109/MC.1980.1653527

[10] A STUDY OF SINGLE EVENT UPSETS IN STATIC RAMS [J].

PRICE, WE ;

NICHOLS, DK ;

SOLIMAN, KA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1506-1508

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