CMOS RAM COSMIC-RAY-INDUCED ERROR-RATE ANALYSIS

被引：26

作者：

PICKEL, JC ^{[1
]}

BLANDFORD, JT ^{[1
]}

机构：

[1] ROCKWELL INT,DIV AUTONET STRATEG SYST,ANAHEIM,CA 92803

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1981年 / 28卷 / 06期

关键词：

D O I：

10.1109/TNS.1981.4335656

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：3962 / 3967

页数：6

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[10] COSMIC-RAY-INDUCED ERRORS IN MOS DEVICES [J].

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