SURFACE STUDY OF A,B-AXIS ORIENTED YBA2CU3O7-DELTA EPITAXIAL THIN-FILMS BY IN-SITU ANGLE-RESOLVED X-RAY PHOTOEMISSION SPECTROSCOPY

被引：4

作者：

TERADA, N ^{[1
]}

ISHIBASHI, S ^{[1
]}

JO, M ^{[1
]}

HIRABAYASHI, M ^{[1
]}

IHARA, H ^{[1
]}

YAMAMOTO, S ^{[1
]}

机构：

[1] NIHON UNIV,COLL SCI & TECHNOL,FUNABASHI,CHIBA 274,JAPAN

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 21期

关键词：

D O I：

10.1063/1.110288

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In situ angle resolved x-ray photoemission spectroscopy has been performed on superconducting a,b-axis oriented YBa2Cu3O7-delta epitaxial films. The relative intensities of the Cu 2p Ba 3d, and Y 3d core emissions have shown the diffraction-like dependence on the electron escape angle due to the spatial distribution of elements in the surface layer. The calculated results by the single scattering cluster model on the surface with the Cu-O outermost layer show a better agreement with the experiment than the (Y, Ba)-O in the outermost layer.

引用

页码：2967 / 2969

页数：3

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