DIRECT OBSERVATION OF SMALL CLUSTER MOBILITY AND RIPENING

被引:65
作者
HEINEMANN, K [1 ]
POPPA, H [1 ]
机构
[1] NASA AMES RES CTR,MOFFETT FIELD,CA 94035
关键词
D O I
10.1016/0040-6090(76)90084-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:237 / 251
页数:15
相关论文
共 25 条
[1]   USE OF FIELD ION MICROSCOPY IN STUDIES OF VAPOUR DEPOSITION OF METALS [J].
BASSETT, DW .
SURFACE SCIENCE, 1970, 23 (01) :240-&
[2]  
BASSETT GA, 1960, P EUR REG C ELECTRON, V1, P270
[3]  
CHAKRAVE.BK, 1967, J PHYS CHEM SOLIDS, V28, P2401, DOI 10.1016/0022-3697(67)90026-1
[4]   IN-SITU SPUTTER CLEANING OF THIN-FILM METAL SUBSTRATES FOR UHV-TEM CORROSION STUDIES [J].
HEINEMANN, K ;
POPPA, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01) :22-25
[5]   OXIDE NUCLEATION ON THIN-FILMS OF COPPER DURING INSITU OXIDATION IN AN ELECTRON-MICROSCOPE [J].
HEINEMANN, K ;
RAO, DB ;
DOUGLASS, DL .
OXIDATION OF METALS, 1975, 9 (04) :379-400
[6]  
HEINEMANN K, 1971, OPTIK, V33, P113
[7]  
HEINEMANN K, 1972, 30TH P ANN EMSA M LO, P610
[8]  
HONJO G, 1974, JPN J APPL PHYS, P537
[9]  
HONJO G, 1974, 4TH INT C CRYST GROW, P98
[10]  
LEE EH, 1974, THESIS STANFORD U