DETECTION OF CATASTROPHIC FAULTS IN ANALOG INTEGRATED-CIRCUITS

被引：115

作者：

MILOR, L ^{[1
]}

VISVANATHAN, V ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1989年 / 8卷 / 02期

关键词：

D O I：

10.1109/43.21830

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：114 / 130

页数：17

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