SILVER DISTRIBUTION IN WET-SENSITIZED AS10GE22.5SE67.5 FILMS AFTER ELECTRON-BEAM EXPOSURE

被引:3
作者
LIANG, YC
TADA, K
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10.1063/1.341863
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O59 [应用物理学];
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页码:1378 / 1383
页数:6
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共 29 条
[1]  
Balasubramanyam K., 1983, Microelectronics Journal, V14, P35, DOI 10.1016/S0026-2692(83)80167-0
[2]   ELECTRON-BEAM INVESTIGATION AND USE OF GE-SE INORGANIC RESIST [J].
CHEN, AS ;
ADDIEGO, G ;
LEUNG, W ;
NEUREUTHER, AR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01) :398-402
[3]   ELECTRON-DIFFRACTION STUDIES OF AG PHOTODOPING IN GEXSE1-X GLASS-FILMS [J].
CHEN, CH ;
TAI, KL .
APPLIED PHYSICS LETTERS, 1980, 37 (07) :605-607
[4]  
DOANE DA, 1982, P S INORGANIC RESIST, V829
[5]   ELECTRON-SPECTROSCOPY AND DIFFRACTION STUDIES OF METAL CONTACT REACTIONS IN AMORPHOUS CHALOCOGENIDES [J].
FITZGERALD, AG ;
MCHARDY, CP .
SURFACE SCIENCE, 1985, 162 (1-3) :568-578
[6]   KINETICS OF PHOTO-DISSOLUTION OF AG IN AMORPHOUS AS2S3 FILMS [J].
GOLDSCHMIDT, D ;
RUDMAN, PS .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1976, 22 (02) :229-243
[7]  
KOSTYSHIN MT, 1966, FIZ TVERD TELA+, V8, P451
[8]  
LIANG YC, IN PRESS THIN SOLID
[9]   AG PHOTODOPING OF AMORPHOUS CHALCOGENIDES [J].
LIS, SA ;
LAVINE, JM .
APPLIED PHYSICS LETTERS, 1983, 42 (08) :675-677
[10]  
LIS SA, 1983, P SOC PHOTO-OPT INST, V393, P34, DOI 10.1117/12.935091