EFFECT OF SPURIOUS REFLECTION ON PHASE-SHIFT INTERFEROMETRY

[1] EFFECT OF PIEZOELECTRIC TRANSDUCER NONLINEARITY ON PHASE-SHIFT INTERFEROMETRY [J]. APPLIED OPTICS, 1987, 26 (06): : 1112 - 1116

[2] AI C, 1987, THESIS U ARIZONA TUC

[3] Bruning J.H., 1978, OPTICAL SHOP TESTING, P409

[4] DIGITAL PHASE-STEPPING INTERFEROMETRY - EFFECTS OF MULTIPLY REFLECTED BEAMS [J]. APPLIED OPTICS, 1987, 26 (13) : 2506 - 2507

[5] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES [J]. APPLIED OPTICS, 1983, 22 (21) : 3421 - 3432

[6] USE OF AN AC HETERODYNE LATERAL SHEAR INTERFEROMETER WITH REAL-TIME WAVEFRONT CORRECTION SYSTEMS [J]. APPLIED OPTICS, 1975, 14 (11) : 2622 - 2626

[7] WYANT JC, 1984, SPR OSA M

[1] EFFECT OF PIEZOELECTRIC TRANSDUCER NONLINEARITY ON PHASE-SHIFT INTERFEROMETRY [J]. APPLIED OPTICS, 1987, 26 (06): : 1112 - 1116

[2] AI C, 1987, THESIS U ARIZONA TUC

[3] Bruning J.H., 1978, OPTICAL SHOP TESTING, P409

[4] DIGITAL PHASE-STEPPING INTERFEROMETRY - EFFECTS OF MULTIPLY REFLECTED BEAMS [J]. APPLIED OPTICS, 1987, 26 (13) : 2506 - 2507

[5] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES [J]. APPLIED OPTICS, 1983, 22 (21) : 3421 - 3432

[6] USE OF AN AC HETERODYNE LATERAL SHEAR INTERFEROMETER WITH REAL-TIME WAVEFRONT CORRECTION SYSTEMS [J]. APPLIED OPTICS, 1975, 14 (11) : 2622 - 2626

[7] WYANT JC, 1984, SPR OSA M