IV CHARACTERISTICS OF POLYSILICON RESISTORS AT HIGH ELECTRIC-FIELD AND THE NON-UNIFORM CONDUCTION MECHANISM

被引：16

作者：

LU, NCC

LU, CY

机构：

[1] NATL CHIAO TUNG UNIV,HSINCHU,TAIWAN

[2] AT&T BELL LABS,READING,PA 19604

来源：

SOLID-STATE ELECTRONICS | 1984年 / 27卷 / 8-9期

关键词：

D O I：

10.1016/0038-1101(84)90028-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：797 / 805

页数：9

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