X-RAY STUDIES ON THE MICROSTRUCTURE OF VACUUM EVAPORATED SNTE THIN-FILMS

被引：4

作者：

SANTHANAM, S

SAMANTARAY, BK

CHAUDHURI, AK

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1982年 / 72卷 / 02期

关键词：

D O I：

10.1002/pssa.2210720212

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：521 / 527

页数：7

共 15 条

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[10] BACKGROUND ERRORS IN X-RAY DIFFRACTION PARAMETERS [J].

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