STUDY OF BORON-NITRIDE GATE INSULATORS GROWN BY LOW-TEMPERATURE PLASMA ENHANCED CHEMICAL VAPOR-DEPOSITION ON INP

被引:18
作者
BATH, A [1 ]
VANDERPUT, PJ [1 ]
SCHOONMAN, J [1 ]
LEPLEY, B [1 ]
机构
[1] DELFT UNIV TECHNOL,INORGAN CHEM LAB,2628 BL DELFT,NETHERLANDS
关键词
D O I
10.1016/0169-4332(89)90426-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:135 / 140
页数:6
相关论文
共 9 条
[1]   DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
STUDNA, AA .
PHYSICAL REVIEW B, 1983, 27 (02) :985-1009
[2]   STRUCTURE AND PROPERTIES OF BORON-NITRIDE FILMS GROWN BY HIGH-TEMPERATURE REACTIVE PLASMA DEPOSITION [J].
HYDER, SB ;
YEP, TO .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (11) :1721-1724
[3]   PREPARATION AND PROPERTIES OF THIN FILM BORON NITRIDE [J].
RAND, MJ ;
ROBERTS, JF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (04) :423-&
[4]  
SCHLEICH DM, 1988, NATO ASI SER E, V141, P178
[5]   LOW-TEMPERATURE DOUBLE-PLASMA PROCESS FOR BN FILMS ON SEMICONDUCTORS [J].
SCHMOLLA, W ;
HARTNAGEL, HL .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (11) :2636-2637
[6]   AMORPHOUS BN FILMS PRODUCED IN A DOUBLE-PLASMA REACTOR FOR SEMICONDUCTOR APPLICATIONS [J].
SCHMOLLA, W ;
HARTNAGEL, HL .
SOLID-STATE ELECTRONICS, 1983, 26 (10) :931-&
[7]  
SCHMOLLA W, 1985, INT J ELECTRON, V58, P35, DOI 10.1080/00207218508939000
[8]  
Wagner C. D., 1979, HDB XRAY PHOTOELECTR
[9]  
YAMAGUCHI E, 1984, J APPL PHYS, V55, P3098, DOI 10.1063/1.333306