SPECKLE-SHEAR INTERFEROMETRY WITH DOUBLE DOVE PRISMS

被引：14

作者：

MOHANTY, RK ^{[1
]}

JOENATHAN, C ^{[1
]}

SIROHI, RS ^{[1
]}

机构：

[1] INDIAN INST TECHNOL,CTR ENGN DESIGN,MADRAS 600036,TAMIL NADU,INDIA

来源：

OPTICS COMMUNICATIONS | 1983年 / 47卷 / 01期

关键词：

D O I：

10.1016/0030-4018(83)90330-9

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：27 / 30

页数：4

共 14 条

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[3]

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[8] IMAGE-SHEARING CAMERA FOR DIRECT MEASUREMENT OF SURFACE STRAINS [J].

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[9] FULL-FIELD OPTICAL STRAIN-MEASUREMENT HAVING POST-RECORDING SENSITIVITY AND DIRECTION SELECTIVITY [J].

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EXPERIMENTAL MECHANICS, 1978, 18 (02) :56-60

[10] IMAGE-SHEARING SPECKLE-PATTERN INTERFEROMETER FOR MEASURING BENDING MOMENTS [J].

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BUTTERS, JN .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (11) :1107-1110

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