CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .6. RENORMALIZED PERTURBATION-THEORY FOR TREATMENT OF ABSORPTION

被引：7

作者：

DAVID, M ^{[1
]}

GEVERS, R ^{[1
]}

SERNEELS, R ^{[1
]}

机构：

[1] RIJKS UNIV CENTRUM ANTWERPEN, FAK WETENSCHAPPEN, Antwerp, BELGIUM

来源：

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 1976年 / 74卷 / 01期

关键词：

D O I：

10.1002/pssb.2220740139

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：359 / 373

页数：15

共 7 条

[1] CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .4. INFLUENCE OF HIGH-ORDER SYSTEMATIC REFLECTIONS [J].

DAVID, M ;

GEVERS, R ;

SERNEELS, R .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 70 (02) :577-590

[2] CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .3. INFLUENCE OF WEAK BEAMS ON DEGENERACY [J].

GEVERS, R ;

DAVID, M ;

SERNEELS, R .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 69 (02) :557-567

[3] CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .2. THEORETICAL-STUDY NEGLECTING ABSORPTION EFFECTS [J].

GEVERS, R ;

SERNEELS, R ;

DAVID, M .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 67 (01) :273-286

[4] CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .1. EIGENVALUE DEGENERACY IN 3-BEAM CASE [J].

GEVERS, R ;

SERNEELS, R ;

DAVID, M .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1974, 66 (02) :471-482

[5]

Nayfeh AH., 1973, PERTURBATION METHODS

[6]

Pritulo M. F., 1962, PMM-J APPL MATH MEC, V26, P661

[7] EFFECT OF INELASTIC WAVES ON ELECTRON DIFFRACTION [J].

YOSHIOKA, H .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1957, 12 (06) :618-628

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