DIRECTIONAL ACOUSTIC MICROSCOPY FOR OBSERVATION OF ELASTIC-ANISOTROPY

[1] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[2] PHYSICAL MODEL FOR ACOUSTIC SIGNATURES [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8237 - 8239

[3] Auld B., 1973, ACOUSTIC FIELDS WAVE, V1

[4] ACOUSTIC MICROSCOPY AT OPTICAL WAVELENGTHS [J]. APPLIED PHYSICS LETTERS, 1978, 32 (12) : 789 - 791

[5] LEAKY SAW VELOCITY ON WATER SILICON BOUNDARY MEASURED BY ACOUSTIC LINE-FOCUS BEAM [J]. ELECTRONICS LETTERS, 1982, 18 (17) : 732 - 734

[6] KUSHIBIKI J, 1981, ELECTRON LETT, V17, P535

[7] Lemons R.A., 1979, PHYS ACOUST, VXIV, P1, DOI [10.1016/B978-0-12-477914-3.50006-2, DOI 10.1016/B978-0-12-477914-3.50006-2]

[8] CHARACTERISTIC MATERIAL SIGNATURES BY ACOUSTIC MICROSCOPY [J]. ELECTRONICS LETTERS, 1978, 14 (12) : 352 - 354

[1] ANGULAR-SPECTRUM APPROACH TO CONTRAST IN REFLECTION ACOUSTIC MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (10) : 5130 - 5139

[2] PHYSICAL MODEL FOR ACOUSTIC SIGNATURES [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (12) : 8237 - 8239

[3] Auld B., 1973, ACOUSTIC FIELDS WAVE, V1

[4] ACOUSTIC MICROSCOPY AT OPTICAL WAVELENGTHS [J]. APPLIED PHYSICS LETTERS, 1978, 32 (12) : 789 - 791

[5] LEAKY SAW VELOCITY ON WATER SILICON BOUNDARY MEASURED BY ACOUSTIC LINE-FOCUS BEAM [J]. ELECTRONICS LETTERS, 1982, 18 (17) : 732 - 734

[6] KUSHIBIKI J, 1981, ELECTRON LETT, V17, P535

[7] Lemons R.A., 1979, PHYS ACOUST, VXIV, P1, DOI [10.1016/B978-0-12-477914-3.50006-2, DOI 10.1016/B978-0-12-477914-3.50006-2]

[8] CHARACTERISTIC MATERIAL SIGNATURES BY ACOUSTIC MICROSCOPY [J]. ELECTRONICS LETTERS, 1978, 14 (12) : 352 - 354