ASPHERICAL SURFACE TESTING WITH SHEARING INTERFEROMETER USING FRINGE SCANNING DETECTION METHOD

被引：42

作者：

YATAGAI, T ^{[1
]}

KANOU, T ^{[1
]}

机构：

[1] RICOH CO LTD, TOKYO 143, JAPAN

来源：

OPTICAL ENGINEERING | 1984年 / 23卷 / 04期

关键词：

D O I：

10.1117/12.7973300

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：357 / 360

页数：4

共 14 条

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