ENHANCED-PERFORMANCE 4K-BY-1 HIGH-SPEED SRAM USING OPTICALLY DEFINED SUBMICROMETER DEVICES IN SELECTED CIRCUITS

被引：5

作者：

CHATTERJEE, PK

SHAH, AH

LIN, YT

HUNTER, WR

WALKER, EA

RHODES, CC

BRUNCKE, WC

机构：

[1] TEXAS INSTRUMENTS INC, LUBBOCK, TX USA

[2] TEXAS INSTRUMENTS INC, HOUSTON, TX USA

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1982年 / 29卷 / 04期

关键词：

D O I：

10.1109/T-ED.1982.20765

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：700 / 706

页数：7

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[5]

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[9]

ISHIKAWA H, 1979, 1979 IEDM TECH DIG, P358

[10]

JACKSON TN, 1979, 1979 IEDM TECH DIG, P56

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