INTERFEROMETRIC OPTICAL-TIME-DOMAIN REFLECTOMETER TO DETERMINE BACKSCATTERING CHARACTERIZATION OF SILICA-BASED GLASS WAVE-GUIDES

被引:27
作者
TAKADA, K
TAKATO, N
NODA, J
UCHIDA, N
机构
[1] NTT Opto-Electronics Laboratories, Nippon Telegraph and Telephone Corporation, Tokai, Ibaraki-ken
来源
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1990年 / 7卷 / 05期
关键词
D O I
10.1364/JOSAA.7.000857
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An interferometric optical-time-domain reflectometer (OTDR) system with high spatial resolution has been developed for diagnosis of optical waveguides and hybrid optical circuits. A spatial resolution as short as 14 mm is obtained by using a newly developed 1.3-mm-wavelength superluminescent diode, and a minimum detectable reflectivity of -100 dB is achieved. Scattering centers that are produced by waveguide irregularities are clearly observed in silica-based glass optical waveguides, and the loss origin of the waveguides is discussed. Also, evaluation of other waveguide characteristics, such as modal birefringence and facet reflectivity, can successfully be made by the OTDR system. © 1990 Optical Society of America.
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页码:857 / 867
页数:11
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